Košík
zboží
(prázdné)
Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks.
číst celé
Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks.
schovat popis
- Nakladatel: Springer International Publishing AG
- Kód:
- Rok vydání: 2017
- Jazyk: Angličtina
- Vazba: Gebunden
- Počet stran: 611
- Šířka balení: 18.9 cm
- Výška balení: 26.2 cm
- Hloubka balení: 4.4 cm
- Váha balení: 1.4 kg
Recenze