Košík
zboží
(prázdné)
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
číst celé
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
schovat popis
- Nakladatel: Springer Science+Business Media
- Kód:
- Rok vydání: 2007
- Jazyk: Angličtina
- Vazba: Sada multimédií
- Počet stran: 689
- Šířka balení: 18.5 cm
- Výška balení: 25.9 cm
- Hloubka balení: 3.5 cm
- Váha balení: 1.7 kg
Recenze